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ADE7816
Data Sheet
Parameter 1, 2
Min
Typ
Max
Unit
Test Conditions/Comments
WAVEFORM SAMPLING
Current and Voltage Channels
Sampling CLKIN/2048, 16.384 MHz/2048 = 8 kSPS
See the Instantaneous Waveforms section
Signal-to-Noise Ratio, SNR
Signal-to-Noise-and-Distortion Ratio, SINAD
Bandwidth (?3 dB)
70
60
2
dB
dB
kHz
PGA = 1
PGA = 1
TIME INTERVAL BETWEEN CHANNELS
Measurement Error
0.3
Degrees
Line frequency = 45 Hz to 65 Hz, HPF on
REFERENCE INPUT
REF IN/OUT Input Voltage Range
Input Capacitance
1.1
1.3
10
V
pF
Minimum = 1.2 V ? 8%; maximum = 1.2 V + 8%
ON-CHIP REFERENCE
Nominal 1.207 V at the REF IN/OUT pin at T A = 25°C
Reference Error
Output Impedance
1.2
±2
mV
k?
Temperature Coefficient
10
50
ppm/°C
Maximum value across full temperature range
of ?40°C to +85°C
CLKIN, CLKOUT
All specifications are for CLKIN, CLKOUT of
16.384 MHz
Input Clock Frequency
Crystal Equivalent Series Resistance
CLKIN Input Capacitance
CLKOUT Output Capacitance
16.22
30
16.384
20
20
16.55
200
MHz
?
pF
pF
LOGIC INPUTS—MOSI/SDA, SCLK/SCL,
SS/HSA, RESET, PULL_HIGH, PULL_LOW
Input High Voltage, V INH
Input Low Voltage, V INL
Input Current, I IN
Input Capacitance, C IN
LOGIC OUTPUTS—IRQ0, IRQ1, MISO/HSD
Output High Voltage, V OH
I SOURCE
Output Low Voltage, V OL
I SINK
POWER SUPPLY
2.0
2.4
100
10
0.8
?8.7
3
800
0.4
2
V
V
μA
μA
nA
pF
V
μA
V
mA
VDD = 3.3 V ± 10%
VDD = 3.3 V ± 10%
Input = 0 V, VDD = 3.3 V
Input = VDD = 3.3 V
Input = VDD = 3.3 V
VDD = 3.3 V ± 10%
VDD = 3.3 V ± 10%
VDD = 3.3 V ± 10%
For specified performance
VDD Pin
I DD
3.0
25
3.6
27.8
V
mA
Minimum = 3.3 V ? 10%; maximum = 3.3 V + 10%
1
2
See the Typical Performance Characteristics section.
See the Terminology section for a definition of the parameters.
Rev. A | Page 4 of 48
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